Brode H, "Cost of Ownership - An Overview. Life Cycle Costs: Evaluation of Avionic Systems Reliability Improvements," Proceedings IEEE Reliability and Maintainability Symposium, 212-216, January 1975
Rose J and Phelps E, "Cost of Ownership Application to Airplane Design," Proceedings IEEE Reliability and Maintainability Symposium, 47-50, January 1979
Ebenezer D and R.J. Harris, "Designing Low Cost of Ownership into Computer Tape Transport," Electronic Engineering, 127-133, October 1979
Turner M, "Cost of Ownership Model," Northcon, 1-5, May 1982
Leckie R, "A Model for Analyzing Test Capacity, Cost, and Productivity," IEEE International Test Conference, 213-218, 1986
Salsgiver A, "A Comparison of CGO Silicon Steels, High Performance Domain Refined Silicon Steels and Amorphous Core Materials in Distribution Transformers by Total Ownership Cost (TOC) Modeling," Physica Scripta, 775-779, January 1989
Jimenez D, "Bringing the Bottom Line to Photolithography," Microelectronics Manufacturing and Test, 1989
Turner M, "Cost-Of-Ownership Model," 1990
Stead J, "Designing for Low Cost of Ownership," Hewlett-Packard Journal, 10-11, April 1991
Carnes R and Su M, "Long Term Cost of Ownership: Beyond Purchase Price," IEEE/SEMI International Manufacturing Science Symposium, 39-43, 1991
DiSessa P and Stone S, "Cost of Ownership for Advanced Optical Lithography," IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop Proceedings, 54-63, October 1991
D. L. Dance and R. Jarvis, "Using Yield Models to Accelerate Learning Curve Progress," 1990 International Semiconductor Manufacturing Science Symposium, May 22, 1990 and IEEE Transactions on Semiconductor Manufacturing, February, 1992, pp. 41-46.
Carrubba E, "Integrating Life-Cycle Cost and Cost-of-Ownership in the Commercial Sector," IEEE Reliability and Maintainability Symposium, 101-108, 1992
Kudva S and Potter R, "Cost Analysis and Risk Assessment for Metrology Applications," SPIE Microlithography Workshop, March 1992
Martinez R, Czitrom V, Pierce N, and Srodes S, "A Methodology for Optimizing Cost of Ownership," SPIE, v1803 363-387, 1992
Dance D, Burghard R, and Markle R, "Reducing Process Equipment Cost of Ownership Through In Situ Contamination Prevention and Reduction," Microcontamination, 21-23, May 1992
Burghard R, Dance D, Markle R, and Silvestri T, "Reducing Tungsten-Etch Equipment Cost of Ownership Through In Situ Contamination Prevention and Reduction," Microcontamination, 33-36, June 1992
Klasche G and Kennen S, "Cost of Ownership," Electronik, 3, 1992
D. L. Dance and K. Gildersleeve, "Estimating Semiconductor Yield from Equipment Particle Measurements," 1992 International Semiconductor Manufacturing Science Symposium, June 15, 1992.
Jimenez D, "The Application of Cost of Ownership Simulation to Mask Writers," Bacus News, 8(8) 1-5, August 1992
Burghard R, Dance D, and Markle R, "Reducing Ion-Implant Equipment Cost of Ownership Through In Situ Contamination Prevention and Reduction," Microcontamination, 27-29, September 1992
Burghard R, Dance D, Markle R, and Silvestri T, "Reducing Tungsten Deposition Equipment Cost of Ownership Through In Situ Contamination Prevention and Reduction," Microcontamination, 23-25, October 1992
Wise L, Mahany R, and Wang L, "Reduced Cost of Ownership with Mix-and-Match," European Semiconductor, 29-31, 1992
Maltabes J, Hakey M, and Levine A, "Cost/Benefit Analysis of Mix-and-Match Lithography for Production of Half-Micron Devices," SPIE Microlithography Workshop, March 1993
Dance D and Bryson P, "Cost of Ownership for Inspection Equipment," SPIE Microlithography Workshop, March 1993
Secrest J, "The Reasoning Behind Cost of Ownership," Semiconductor International, 56-60, May 1993
Jimenez D and Ignatius H, "The Application of Cost of Ownership Simulation to Wafer Sort and Final Test," SEMI Manufacturing Test Conference, July 1993
Dance D, "Estimating the Cost of Ownership for Test and Metrology," SEMI Manufacturing Test Conference, July 1993
LaFrance R and Westrate S, "Cost of Ownership: The Supplier's View," Solid State Technology, 33-37, July 1993
E. Neacy, N. Abt, S. Brown, M. McDavid, J. Robinson, S. Srodes, and T. Stanley, “Cost Analysis for a Multiple Product / Multiple Process Factory: Application of SEMATECH’s Future Factory Design Methodology,” Proceedings of the Advanced Semiconductor Manufacturing Conference, Boston, MA, 1993.
Hills R and Maher J, "Cost of Ownership Analysis: Model 384T and ASIQ," Drytek Document, 1993
Anderson B, Behnke J, Berman M, Kobeissi H, Huling B, Langan J, Lynn S, and Morgan R, "Using COO to Select Nitride PECVD Clean Cycle," Semiconductor International, 86-88, October 1993
Ristelhueber R, "New Fabs Don't Have to Cost $1 Billion," Electronic Business Buyer, 63-65, December 1993
Ching G and Murtha R, "Comparing Cost of Ownership for 200- and 150-MM Immersion Wet-Cleaning Equipment," Microcontamination, 29-32, January 1994
Doering R, "Cost-of-Ownership Issues in a Flexible Manufacturing Environment," Solid State Technology, 39-43, February 1994
Burggraaf P, "Applying Cost Modeling to Stepper Lithography," Semiconductor International, 40-44, February 1994
Dance D and Jimenez D, "Applications of Cost-of-Ownership," Semiconductor International, 6-7, September 1994
P. A. Jensen and J. K. Robinson, “Deming’s Quality Principles Applied to a Large Lecture Course,” ASEE Journal of Engineering Education, January 1995.
D. Dance, “Cost of Ownership Analysis for Metrology Tools,” NIST Semiconductor Metrology Workshop, January 1995
Decker D and Markley A, "Cost Drivers of CMP Equipment and Associated Processes," Internal Paper, 1995
Williams J, "Beyond Statistical Experimental Design: Financial Considerations For Engineering Problem Solving," Tegal European Plasma Seminar Proceedings, 47-60, March 1995
Chao L, Dance D, and DiFloria T, "Get a Handle on Your Cost of Test," Test & Measurement World, 45-50, April 1995
Roussos T, "A Tool for Equipment Users, Manufacturers," Ceramic Industry, 119-121, April 1995
Jimenez D, "Cost of Ownership Modeling Software and Innovative Database Provide Keys to Productivity Improvement," Semiconductor Fabtech 95, June 1995
Case C and Case C, "Intermetal Dielectric Cost-of-Ownership," Semiconductor International, 83-88, June 1995
Thompson A, Kroll W, McKee M, Stall R, and Zawadzski P, "A Cost of Ownership Model for CVD Processes," III-Vs Review, Vol. 8, No. 3, June 1995
Dance D and Jimenez D, "Cost of Ownership: A Tool for Environment, Safety, and Health Improvements," Semiconductor International, 6-8, September 1995
Rust W and Lodoen M, "Cost-of-Ownership: Use and Misuse," Semiconductor International, 109-112, November 1995
Dance D, DiFloria T, and Jimenez D, "Modeling the Cost of Ownership of Assembly and Inspection", IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part C: Manufacturing, v19 57-60, January 1996
Hegarty C and Meier F, "COO Analysis for Automatic Semiconductor Assembly," Solid State Technology Packaging Assembly & Test Supplement, S10-S14, March 1996
Jimenez D, "Process Equipment Cost Modeling," Society of Plastics Engineers Technical Papers, Vol. III, 2964-2969, May 1996
Bouldin D and Jimenez D, "The Benefits of Broadbased Implementation of Cost of Ownership Modeling," Semiconductor Fabtech, Vol. 4, 43-48, May 1996
D. Dance and D. Jimenez, “Semiconductor Equipment Performance Metrics: Cost of Ownership and Overall Equipment Effectiveness,” Semiconductor International, Mid-November 1996, pp. 6-8.
F. Chance, J. K. Robinson and J. W. Fowler, “Supporting Manufacturing With Simulation: Model Design, Development, and Deployment,” Proceedings of the 1996 Winter Simulation Conference, San Diego, CA, 1996.
Gruninger M and Levine A, "Applying Cost-of-Ownership Methodology to Drive Making," Data Storage, 49-53, January 1997
Biet J, "Fast and Responsive Operational Management," Signal, 10-12, January/February 1997
W. Lashbrook, P. O’Hara, D. Dance, A. Veltri, “Design for Environmental Tools for Management Decision Making: A Selected Case Study,” Proceedings of the 1st International Symposium on Electronics and the Environment: Conference Proceedings, pp. 184 – 188, May 1997.
J. Jasadiredja., Methodology of Determining Optimal Cluster Equipment Configuration, INFORMS Conference Dallas 1997
S. Brown, F. Chance, J. W. Fowler, and J. K. Robinson, “A Centralized Approach to Factory Simulation”, Future Fab International, Vol. 3, 83-86, 1997.
F. Chance and J. K. Robinson, “Integrating Cost, Capacity, and Simulation Analysis,” 1997. Applied Cost Modeling
N. S. Grewal, A. C. Bruska, T. M. Wulf, and J. K. Robinson, “Integrating Targeted Cycle-Time Reduction Into The Capital Planning Process,” Proceedings of the 1998 Winter Simulation Conference, Washington, DC, 1005-1010, 1998.
J. Jasadiredja, Effect of Variability in the Wafer Fab. Advanced Semiconductor Manufacturing Conference 1999, Tokyo, Japan
N. S. Grewal, A. C. Bruska, T. M. Wulf, and J. K. Robinson, “Validating Simulation Model Cycle Times at Seagate Technology.” In Proceedings of the 1999 Winter Simulation Conference, ed. P. A. Farrington, H. B. Nembhard, D. T. Sturrock, and G. W. Evans, 843-849. Institute of Electrical and Electronics Engineers, Piscataway, New Jersey, 1999.
R. Kotcher and F. Chance, “Capacity Planning in the Face of Product-Mix Uncertainty,” 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings, Santa Clara, CA, 73-76, October 11-13, 1999.
J. K. Robinson and R. Giglio, “Capacity Planning for Semiconductor Wafer Fabrication with Time Constraints between Operations.” In Proceedings of the 1999 Winter Simulation Conference, ed. P. A. Farrington, H. B. Nembhard, D. T. Sturrock, and G. W. Evans, 880-887. Institute of Electrical and Electronics Engineers, Piscataway, New Jersey, 1999.
D. Dance and R. Jarvis, “Impact of Yield Variance on Cost of Ownership,” 2000 Modeling and Statistical Methods Symposium, Phoenix, AZ.
D. Dance, D. Lauben, and D. Lam, “Selection, Analysis and Development of Greenfield Sites for 300mm Fabs,” Semiconductor International, November-December 2000.
H. Ignatius and D. Dance, “Using COO as a Process Control Metric”, APC/AEC, Dresden, 2002.
D. Jimenez, “CMP Cost Drivers: An Overview of CMP Cost of Ownership,” CMP World, November 2003
D. Lauben, J. Jasadiredja, S. Wheelock, Use of Advanced Cost Modeling to Provide Military Reliability at Commercial Cost Structures, Components for Military and Space Electronics (CMSE) Conference 2003.
D. Dance, “Is There Life in 200mm?,” Applied Cost Modeling, December 2003
D. Dance, “Lessons Learned from SEMATECH: Finding the Benefits in Public/Private Technology Ventures,” Silicon Solar Cell Symposium, 2004, National Renewable Energy Lab.
D. Dance and D. Jimenez, “Lithography Cost of Ownership: Revisited,” Semiconductor International, July 2004
D. Dance, “Estimating Pre-Horizon Short Interval Scheduling Simulation Errors,” Applied Cost Modeling, December 2004
S. Murthy, M. Falcon, S. Sreenivasan, and D. Dance, “S-FIL™ Technology: Cost of Ownership Case Study,” SPIE Microlithography Conference, March 2005
D. Jimenez, “Cost of Ownership Impacts on LPCVD Nitride Deposition,” Integrated Materials, Inc. publication, April 2006
D. Jimenez, “Advantages of a Factory/Global Perspective in Test Floor Optimization,” Global OPENSTAR Conference, May 2006
S. Benner and D. Dance, “CMP Productivity Improvement Using Pad Surface Management,” 3rd Annual ISMI Symposium, Austin Texas, October 2006.
D. Jimenez, “Cost of Ownership Impacts on LPCVD Poly Silicon Deposition,” Integrated Materials, Inc. publication, December 2006
Patent No. US 7,245,980 -- Method and Apparatus for Calculation of Production Quantities, Daren Dance and David Jimenez, Granted July 17, 2007, Assigned to Wright Williams & Kelly, Inc., Pleasanton CA.