For a test cell with a single prober or single handler module, PRO COOL® for Wafer Sort & Final Test may report different test controller and handler module maximum process rates. Since these two modules are linked together, they should have the same rates.
The handler is controlled by the test controller in most test cells, but in a single handler test cell, the test controller availability is also limited by handler availability. If one is down, the other is down as well. In defining this two module test cell, show the handler controlled by the test controller and show the test controller controlled by the handler.